Invention Grant
- Patent Title: Pellicle and method for producing pellicle
- Patent Title (中): 防护薄膜组件和防护薄膜制造方法
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Application No.: US12466042Application Date: 2009-05-14
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Publication No.: US07919217B2Publication Date: 2011-04-05
- Inventor: Yoshihiro Kubota , Shoji Akiyama , Toshihiko Shindo
- Applicant: Yoshihiro Kubota , Shoji Akiyama , Toshihiko Shindo
- Applicant Address: JP Tokyo
- Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-134261 20080522
- Main IPC: G03F1/00
- IPC: G03F1/00 ; A47G1/12

Abstract:
A pellicle film of a silicon single crystal film and a base substrate supporting the pellicle film are formed of a single substrate using an SOI substrate. The base substrate is provided with an opening whose ratio in area to an exposure region when a pellicle is used on a photomask (an open area ratio) is 60% or more, and provided with a reinforcing frame in a non-exposure region of the base substrate. Since the pellicle film and the base substrate supporting the pellicle film are formed of the single substrate (an integrated structure), and the base substrate is provided with the reinforcing frame, the effect of increased strength is obtained. Moreover, a principal plane of a silicon single crystal film is a crystal plane inclined at 3 to 5° from any lattice plane belonging to {100} planes or {111} planes.
Public/Granted literature
- US20090291372A1 PELLICLE AND METHOD FOR PRODUCING PELLICLE Public/Granted day:2009-11-26
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