Invention Grant
- Patent Title: Method and structure to reduce cracking in flip chip underfill
- Patent Title (中): 倒装芯片底部填充物的开裂方法和结构
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Application No.: US11831026Application Date: 2007-07-31
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Publication No.: US07919356B2Publication Date: 2011-04-05
- Inventor: Mukta G. Farooq , Robert Hannon , Dae-Young Jung , Ian D. Melville
- Applicant: Mukta G. Farooq , Robert Hannon , Dae-Young Jung , Ian D. Melville
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Katherine Brown
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method of assembling a microelectronic flip-chip arrangement includes attaching a chip having a defined length to a supporting substrate, wherein the chip forms a chip shadow line of the defined length on the supporting substrate, creating a first non-wettable zone on an outer portion of the bottom surface of the chip, creating a second non-wettable zone on a portion of the supporting substrate outside the chip shadow line, underfilling the chip and forming a fillet, wherein the fillet does not extend beyond the chip shadow line, and hardening the underfill including the fillet.
Public/Granted literature
- US20090032974A1 METHOD AND STRUCTURE TO REDUCE CRACKING IN FLIP CHIP UNDERFILL Public/Granted day:2009-02-05
Information query
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