Invention Grant
- Patent Title: Optical standard for the calibration and characterization of optical measuring devices
- Patent Title (中): 用于光学测量装置的校准和表征的光学标准
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Application No.: US12505660Application Date: 2009-07-20
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Publication No.: US07919744B2Publication Date: 2011-04-05
- Inventor: Ute Resch-Genger , Katrin Hoffmann , Thomas Behnke , Christian Wuerth
- Applicant: Ute Resch-Genger , Katrin Hoffmann , Thomas Behnke , Christian Wuerth
- Applicant Address: DE Berlin
- Assignee: Bam Bundesanstalt fuer Materialforschung und Pruefung
- Current Assignee: Bam Bundesanstalt fuer Materialforschung und Pruefung
- Current Assignee Address: DE Berlin
- Agency: Harness, Dickey & Pierce, PLC
- Priority: EP09156073 20090324
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).
Public/Granted literature
- US20100243876A1 Optical Standard for the Calibration and Characterization of Optical Measuring Devices Public/Granted day:2010-09-30
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