Invention Grant
- Patent Title: Image sensor and method of manufacturing the same
- Patent Title (中): 图像传感器及其制造方法
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Application No.: US12265660Application Date: 2008-11-05
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Publication No.: US07919796B2Publication Date: 2011-04-05
- Inventor: Ju Hyun Kim , Jae Hyun Kang
- Applicant: Ju Hyun Kim , Jae Hyun Kang
- Applicant Address: KR Seoul
- Assignee: Dongbu HiTek Co., Ltd.
- Current Assignee: Dongbu HiTek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: The Law Offices of Andrew D. Fortney
- Agent Andrew D. Fortney; William K. Nelson
- Priority: KR10-2007-0117030 20071116
- Main IPC: H01L31/062
- IPC: H01L31/062 ; H01L31/113 ; H01L31/036 ; H01L27/148 ; H01L29/768

Abstract:
Provided is an image sensor. The image sensor includes a semiconductor substrate, an interlayer dielectric, metal interconnections, a first electrode, a lower electrode, a second electrode, and a photodiode. The semiconductor substrate has at least one transistor thereon. The interlayer dielectric is on the semiconductor substrate. The metal interconnections pass through the interlayer dielectric. The first electrode is in the interlayer dielectric between the metal interconnections. The lower electrode is on the interlayer dielectric to connect to the metal interconnection. The second electrode is on the interlayer dielectric at a position corresponding to the first electrode, and a gap region is between the second electrode and the lower electrode. The photodiode is on the interlayer dielectric with the lower electrode and the second electrode.
Public/Granted literature
- US20090127599A1 Image Sensor and Method of Manufacturing the Same Public/Granted day:2009-05-21
Information query
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