Invention Grant
US07919974B2 Electronic device test apparatus and method of configuring electronic device test apparatus
失效
电子设备测试仪器及配置电子设备测试仪器的方法
- Patent Title: Electronic device test apparatus and method of configuring electronic device test apparatus
- Patent Title (中): 电子设备测试仪器及配置电子设备测试仪器的方法
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Application No.: US11570682Application Date: 2005-07-22
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Publication No.: US07919974B2Publication Date: 2011-04-05
- Inventor: Kazuyuki Yamashita , Yoshiyuki Masuo
- Applicant: Kazuyuki Yamashita , Yoshiyuki Masuo
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein P.L.C.
- Priority: JP2004-215802 20040723
- International Application: PCT/JP2005/013493 WO 20050722
- International Announcement: WO2006/009253 WO 20060126
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/26
Abstract:
A handler is configured by, separably and connectably, a plurality of types of handling modules of different throughputs and a plurality of types of test modules of different numbers of simultaneous measurements and/or test temperatures. Based on the maximum number of measurable pins of the tester outputting a test pattern and examining a response pattern, the number of terminals of the DUTs, and the test time, the throughput of the handling module and the number of simultaneous measurements and/or test temperature of the test module are selected and combined.
Public/Granted literature
- US20080042667A1 Electronic Device Test Apparatus and Method of Configuring Electronic Device Test Apparatus Public/Granted day:2008-02-21
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