Invention Grant
- Patent Title: Transistor diagnostic circuit
- Patent Title (中): 晶体管诊断电路
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Application No.: US12548293Application Date: 2009-08-26
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Publication No.: US07919976B2Publication Date: 2011-04-05
- Inventor: Alan R. Ball
- Applicant: Alan R. Ball
- Applicant Address: US AZ Phoenix
- Assignee: Semiconductor Components Industries, LLC
- Current Assignee: Semiconductor Components Industries, LLC
- Current Assignee Address: US AZ Phoenix
- Agent Robert F. Hightower
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
Public/Granted literature
- US20090315585A1 TRANSISTOR DIAGNOSTIC CIRCUIT Public/Granted day:2009-12-24
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