Invention Grant
- Patent Title: Correlated double sampling circuit
- Patent Title (中): 相关双采样电路
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Application No.: US12318800Application Date: 2009-01-08
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Publication No.: US07919993B2Publication Date: 2011-04-05
- Inventor: Min-Sun Keel , Kwang-Hyun Lee
- Applicant: Min-Sun Keel , Kwang-Hyun Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, PLC
- Priority: KR10-2008-0015920 20080221
- Main IPC: G11C27/02
- IPC: G11C27/02 ; H03K5/00 ; H03K17/00

Abstract:
A correlated double sampling circuit includes a first capacitor and a comparator. The first capacitor may be configured to receive a ramp signal via a first end. The comparator may be configured to receive the ramp signal and an output signal of a unit pixel circuit via a differential amplifier included in the comparator. The comparator may be also be configured to compare the output signal with the ramp signal and may be configured to directly receive the output signal of the unit pixel circuit at a first input terminal of the differential amplifier. A second input terminal of the differential amplifier is connected to a second end of the first capacitor.
Public/Granted literature
- US20090212827A1 Correlated double sampling circuit Public/Granted day:2009-08-27
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