Invention Grant
US07920252B2 Method and apparatus for spectrophotometric characterization of turbid materials 有权
浑浊物质分光光度法的方法和装置

  • Patent Title: Method and apparatus for spectrophotometric characterization of turbid materials
  • Patent Title (中): 浑浊物质分光光度法的方法和装置
  • Application No.: US12250611
    Application Date: 2008-10-14
  • Publication No.: US07920252B2
    Publication Date: 2011-04-05
  • Inventor: Xin Hua Hu
  • Applicant: Xin Hua Hu
  • Priority: CN20071005994 20071019
  • Main IPC: G01J3/42
  • IPC: G01J3/42
Method and apparatus for spectrophotometric characterization of turbid materials
Abstract:
Method and apparatus for spectrophotometric characterization of turbid materials are provided. An incident light beam is used to illuminate a turbid material sample and optical signals of coherent reflectance, diffuse reflectance, collimated transmittance and diffuse transmittance are measured from the sample as functions of wavelength. The following optical parameters are determined as functions of wavelength for spectrophotometric characterization of the turbid material sample in the spectrum of interest: absorption coefficients μa, scattering coefficient μs, anisotropy factor g and real refractive index n.
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