Invention Grant
- Patent Title: Systems for measuring backscattered light using rotating mirror
- Patent Title (中): 使用旋转镜测量背散射光的系统
-
Application No.: US12211918Application Date: 2008-09-17
-
Publication No.: US07920262B2Publication Date: 2011-04-05
- Inventor: Gorden W. Videen , Karri Olavi Muinonen
- Applicant: Gorden W. Videen , Karri Olavi Muinonen
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee Address: US DC Washington
- Agent Christos S. Kyriakou; Alan I. Kalb
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
A system for measuring backscattered light from a sample is given. Light is output from a light source towards a rotating mirror, and then reflected by the rotating mirror towards the sample. The sample reflects backscattered light back towards the rotating mirror, which, having moved during the time it took for the light to propagate from the mirror to the sample and back, reflects the backscattered light to a detector located at a physical separation from the light source. The detected backscattered light may be analyzed to determine various properties of the sample.
Public/Granted literature
- US20100067007A1 SYSTEMS FOR MEASURING BACKSCATTERED LIGHT USING FINITE SPEED OF LIGHT Public/Granted day:2010-03-18
Information query
