Invention Grant
- Patent Title: Resistance variable memory apparatus
- Patent Title (中): 电阻变量存储装置
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Application No.: US12514025Application Date: 2007-11-16
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Publication No.: US07920402B2Publication Date: 2011-04-05
- Inventor: Yoshikazu Katoh , Kazuhiko Shimakawa , Zhiqiang Wei
- Applicant: Yoshikazu Katoh , Kazuhiko Shimakawa , Zhiqiang Wei
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-310913 20061117
- International Application: PCT/JP2007/072254 WO 20071116
- International Announcement: WO2008/059946 WO 20080522
- Main IPC: G11C17/00
- IPC: G11C17/00 ; G11C11/00

Abstract:
A resistance variable memory apparatus (100) of the present invention is a resistance variable memory apparatus (100) using a resistance variable element (22) transitioning between plural resistance states in response to electric pulses of the same polarity, in which a series resistance setting unit (10) is configured to set a resistance value of the series current path and a parallel resistance setting unit (30) is configured to set a resistance value of a parallel current path such that the resistance values become resistance values at which a node potential is not larger than a second voltage level in a state where an electric pulse application device (50) is outputting a first electric pulse after the resistance variable element (22) has switched to the high-resistance state, and the node potential is not larger than a first voltage level in the state where the electric pulse application device (50) is outputting a second electric pulse after the resistance variable element (22) has switched to the low-resistance state.
Public/Granted literature
- US20100046270A1 RESISTANCE VARIABLE MEMORY APPARATUS Public/Granted day:2010-02-25
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