Invention Grant
- Patent Title: Non volatile memory circuit with tailored reliability
- Patent Title (中): 非易失性存储器电路具有量身定制的可靠性
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Application No.: US12114574Application Date: 2008-05-02
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Publication No.: US07920423B1Publication Date: 2011-04-05
- Inventor: Yanjun Ma , Steven I. Mozsgai
- Applicant: Yanjun Ma , Steven I. Mozsgai
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Fenwick & West LLP
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A non-volatile memory (NVM) circuit is provided, that includes at least a first and second NVM sub-array. The first sub-array is built from first memory cells. The second NVM sub-array is built from second memory cells that are constructed differently from the first memory cells. The NVM sub-arrays share a support circuit. In some embodiments the sub-arrays can be constructed, so that they exhibit different characteristics tailored to their intended use. For example one sub-array might be tailored for data retention, while the next sub-array for programming endurance, still another for write disturb immunity.
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