Invention Grant
US07920992B2 Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes
失效
用于对集成电路，系统和制造过程中的不确定性进行建模的方法和系统
- Patent Title: Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes
- Patent Title (中): 用于对集成电路，系统和制造过程中的不确定性进行建模的方法和系统
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Application No.: US11370711Application Date: 2006-03-08
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Publication No.: US07920992B2Publication Date: 2011-04-05
- Inventor: Rob A. Rutenbar , James D. Ma , Claire F. Fang , Amith Singhee
- Applicant: Rob A. Rutenbar , James D. Ma , Claire F. Fang , Amith Singhee
- Applicant Address: US PA Pittsburgh
- Assignee: Carnegie Mellon University
- Current Assignee: Carnegie Mellon University
- Current Assignee Address: US PA Pittsburgh
- Agency: Moore & Van Allen PLLC
- Agent Charles L. Moore
- Main IPC: G06F17/10
- IPC: G06F17/10
Abstract:
A method and system for modeling uncertainties in integrated circuits, systems and fabrication processes may include defining interval values for each uncertain component or parameter in a circuit or system. The method may also include replacing scalar operations with interval operations in an algorithm and discontinuing interval operations in the algorithm in response to a predetermined condition. The method may also include generating a plurality of scalar samples from a plurality of intervals and determine a distribution of each uncertain component or parameter from the scalar samples of the intervals.
Public/Granted literature
- US20060206294A1 Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes Public/Granted day:2006-09-14
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