Invention Grant
- Patent Title: Systems and methods for diagnosing faults in electronic systems
- Patent Title (中): 用于诊断电子系统故障的系统和方法
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Application No.: US12130478Application Date: 2008-05-30
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Publication No.: US07921337B2Publication Date: 2011-04-05
- Inventor: Robert C. McCroskey , Dinkar Mylaraswamy
- Applicant: Robert C. McCroskey , Dinkar Mylaraswamy
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Ingrassia Fisher & Lorenz
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Apparatus, systems, and methods for identifying a fault in an electronic system are provided. One apparatus includes memory storing a model of the electronic system, a processor, and a fault module. The processor is configured to pass system inputs through the model to generate corresponding simulated outputs, and the fault module is configured to determine the fault based on a comparison of the system outputs and the simulated outputs. A system includes an electronic system including multiple components generating system outputs based on system inputs and the apparatus for identifying a fault in the electronic system discussed above. One method includes generating a model of the electronic system, passing one or more inputs to the electronic system through the model to generate corresponding simulated outputs, and determining the fault based on a comparison of the one or more simulated outputs and one or more electronic system outputs.
Public/Granted literature
- US20090300429A1 SYSTEMS AND METHODS FOR DIAGNOSING FAULTS IN ELECTRONIC SYSTEMS Public/Granted day:2009-12-03
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