Invention Grant
US07921343B2 Testing system, testing system control method, and test apparatus
有权
测试系统,测试系统控制方法和测试仪器
- Patent Title: Testing system, testing system control method, and test apparatus
- Patent Title (中): 测试系统,测试系统控制方法和测试仪器
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Application No.: US11730254Application Date: 2007-03-30
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Publication No.: US07921343B2Publication Date: 2011-04-05
- Inventor: Haruyoshi Ono
- Applicant: Haruyoshi Ono
- Applicant Address: JP Yamanashi
- Assignee: Eudyna Devices Inc.
- Current Assignee: Eudyna Devices Inc.
- Current Assignee Address: JP Yamanashi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2006-101121 20060331
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A testing system including a plurality of test applying portions that operate a test device for outputting an output signal; a plurality of testing portions that test the output signal of the test device; and a switch portion that switches the output signal between the test applying portions and the testing portions. The testing portions each have a test information portion that outputs test item information which includes a test capability of the testing portion, and have a test performing portion which is selected under the test item information that receives the output signal from the test applying portion through the switch portion, and performs a test under a designated test item.
Public/Granted literature
- US20070245188A1 Testing system, testing system control method, and test apparatus Public/Granted day:2007-10-18
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