Invention Grant
- Patent Title: Automated test system
- Patent Title (中): 自动测试系统
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Application No.: US11132569Application Date: 2005-05-19
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Publication No.: US07921345B2Publication Date: 2011-04-05
- Inventor: Craig R. Trump , Noah H. Smith , Peter D. Rega , Akhil Patel , Jeffrey Carollo , John R. Morton
- Applicant: Craig R. Trump , Noah H. Smith , Peter D. Rega , Akhil Patel , Jeffrey Carollo , John R. Morton
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/40

Abstract:
A system comprising a plurality of components and an automation module coupled to the plurality of components. The automation module is adapted to automatically initialize a software test environment for at least one of the plurality of components, where the software test environment prepares the at least one of the plurality of components to be tested. The automation module also is adapted to, without transferring a testing agent to the at least one of the plurality of components, automatically test the at least one of the plurality of components.
Public/Granted literature
- US20060265627A1 Automated test system Public/Granted day:2006-11-23
Information query
IPC分类: