Invention Grant
- Patent Title: Controlling impedance and thickness variations for multilayer electronic structures
- Patent Title (中): 控制多层电子结构的阻抗和厚度变化
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Application No.: US12101455Application Date: 2008-04-11
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Publication No.: US07921403B2Publication Date: 2011-04-05
- Inventor: John Richard Dangler , Matthew Stephen Doyle
- Applicant: John Richard Dangler , Matthew Stephen Doyle
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Matthew C. Zehrer
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H03K17/693 ; H05K1/00 ; H05K1/09

Abstract:
Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a process of generating equalization data and a design structure for multilayer electronic structures is presented.
Public/Granted literature
- US20090255713A1 Controlling Impedance and Thickness Variations for Multilayer Electronic Structures Public/Granted day:2009-10-15
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