Invention Grant
US07921403B2 Controlling impedance and thickness variations for multilayer electronic structures 有权
控制多层电子结构的阻抗和厚度变化

Controlling impedance and thickness variations for multilayer electronic structures
Abstract:
Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a process of generating equalization data and a design structure for multilayer electronic structures is presented.
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