Invention Grant
- Patent Title: Determining calibration information for an x-ray apparatus
- Patent Title (中): 确定X射线设备的校准信息
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Application No.: US12436267Application Date: 2009-05-06
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Publication No.: US07922391B2Publication Date: 2011-04-12
- Inventor: Robert Essenreiter , Michael Bertram , Martin Ringholz
- Applicant: Robert Essenreiter , Michael Bertram , Martin Ringholz
- Applicant Address: DE Feldkirchen
- Assignee: Brainlab AG
- Current Assignee: Brainlab AG
- Current Assignee Address: DE Feldkirchen
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Priority: EP08156293 20080515
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
A device and method are provided that enable calibration information to be determined for an x-ray apparatus that performs a three-dimensional x-ray scan. The calibration information is determined using an adapting method, wherein the adapting method is based on a position of an x-ray source relative to an x-ray unit marker device during image acquisition, an x-ray unit data set that describes the position of the x-ray unit marker device during image acquisition, and a two-dimensional calibration data set that describes at least one and preferably two actual two-dimensional x-ray images produced by irradiating a calibration object.
Public/Granted literature
- US20090285366A1 DETERMINING CALIBRATION INFORMATION FOR AN X-RAY APPARATUS Public/Granted day:2009-11-19
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