Invention Grant
US07922862B2 Plasma processing apparatus, electrode plate for plasma processing apparatus, and electrode plate manufacturing method
有权
等离子体处理装置,等离子体处理装置用电极板及电极板的制造方法
- Patent Title: Plasma processing apparatus, electrode plate for plasma processing apparatus, and electrode plate manufacturing method
- Patent Title (中): 等离子体处理装置,等离子体处理装置用电极板及电极板的制造方法
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Application No.: US12505940Application Date: 2009-07-20
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Publication No.: US07922862B2Publication Date: 2011-04-12
- Inventor: Katsuya Okumura , Shinji Himori , Kazuya Nagaseki , Hiroki Matsumaru , Shoichiro Matsuyama , Toshiki Takahashi
- Applicant: Katsuya Okumura , Shinji Himori , Kazuya Nagaseki , Hiroki Matsumaru , Shoichiro Matsuyama , Toshiki Takahashi
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Octec Inc.,Tokyo Electron Limited
- Current Assignee: Octec Inc.,Tokyo Electron Limited
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2003-025899 20030203; JP2003-132810 20030512; JP2004-025007 20040202
- Main IPC: H01L21/00
- IPC: H01L21/00 ; C23C14/00 ; C23C16/00

Abstract:
A plasma processing apparatus for performing a plasma process on a target substrate includes a process container configured to accommodate the target substrate and to reduce pressure therein. A first electrode is disposed within the process container. A supply system is configured to supply a process gas into the process container. An electric field formation system is configured to form an RF electric field within the process container so as to generate plasma of the process gas. A number of protrusions are discretely disposed on a main surface of the first electrode and protrude toward a space where the plasma is generated.
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