Invention Grant
- Patent Title: Through-via and method of forming
- Patent Title (中): 通孔和成型方法
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Application No.: US12277458Application Date: 2008-11-25
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Publication No.: US07923369B2Publication Date: 2011-04-12
- Inventor: Bradley P. Smith
- Applicant: Bradley P. Smith
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu; Kim-Marie Vo
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
In one embodiment, a method of forming a via includes forming an first opening in the semiconductor substrate, wherein the first opening has a bottom and sidewalls, forming a sacrificial fill in the first opening, forming a dielectric layer over the sacrificial fill, forming a second opening in the dielectric layer, wherein the second opening is over the sacrificial fill, removing the sacrificial fill from the first opening after forming the second opening, and forming a conductive material in the first opening and second opening.
Public/Granted literature
- US20100130008A1 THROUGH-VIA AND METHOD OF FORMING Public/Granted day:2010-05-27
Information query
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