Invention Grant
US07923379B2 Multi-step process for forming high-aspect-ratio holes for MEMS devices
有权
用于形成MEMS器件的高纵横比孔的多步法
- Patent Title: Multi-step process for forming high-aspect-ratio holes for MEMS devices
- Patent Title (中): 用于形成MEMS器件的高纵横比孔的多步法
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Application No.: US12347250Application Date: 2008-12-31
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Publication No.: US07923379B2Publication Date: 2011-04-12
- Inventor: Jiou-Kang Lee , Ting-Hau Wu , Shang-Ying Tsai , Jung-Huei Peng , Chun-Ren Cheng
- Applicant: Jiou-Kang Lee , Ting-Hau Wu , Shang-Ying Tsai , Jung-Huei Peng , Chun-Ren Cheng
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/31
- IPC: H01L21/31

Abstract:
A method of forming an integrated circuit structure includes forming an opening in a substrate, with the opening extending from a top surface of the substrate into the substrate. The opening is filled with a filling material until a top surface of the filling material is substantially level with the top surface of the substrate. A device is formed over the top surface of the substrate, wherein the device includes a storage opening adjoining the filling material. A backside of the substrate is grinded until the filling material is exposed. The filling material is removed from the channel until the storage opening of the device is exposed.
Public/Granted literature
- US20100120260A1 Multi-Step Process for Forming High-Aspect-Ratio Holes for MEMS Devices Public/Granted day:2010-05-13
Information query
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