Invention Grant
US07923379B2 Multi-step process for forming high-aspect-ratio holes for MEMS devices 有权
用于形成MEMS器件的高纵横比孔的多步法

Multi-step process for forming high-aspect-ratio holes for MEMS devices
Abstract:
A method of forming an integrated circuit structure includes forming an opening in a substrate, with the opening extending from a top surface of the substrate into the substrate. The opening is filled with a filling material until a top surface of the filling material is substantially level with the top surface of the substrate. A device is formed over the top surface of the substrate, wherein the device includes a storage opening adjoining the filling material. A backside of the substrate is grinded until the filling material is exposed. The filling material is removed from the channel until the storage opening of the device is exposed.
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