Invention Grant
- Patent Title: Test equipment and test system using the same
- Patent Title (中): 测试设备和测试系统使用相同
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Application No.: US12497641Application Date: 2009-07-03
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Publication No.: US07923988B2Publication Date: 2011-04-12
- Inventor: Jui-Che Tsai
- Applicant: Jui-Che Tsai
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agent Raymond J. Chew
- Priority: CN200820302193 20080919
- Main IPC: G01R13/00
- IPC: G01R13/00

Abstract:
A test equipment to test power over Ethernet (PoE) function of an Ethernet device comprises a first connector, a second connector, a data signal transmission circuit, a first polarity determination circuit, a second polarity determination circuit and a notification circuit. The first connector receives and transmits data signals and power signals transmitted by the Ethernet device. The data signal transmission circuit transmits the data signals to the second connector and outputs the power signals. The first and second polarity determination circuits receive and output the power signals to the notification circuit. The notification circuit receives the power signals and consequently generates a notice to indicate the PoE function of the Ethernet device is normal.
Public/Granted literature
- US20100072982A1 TEST EQUIPMENT AND TEST SYSTEM USING THE SAME Public/Granted day:2010-03-25
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