Invention Grant
- Patent Title: Signal testing apparatus
- Patent Title (中): 信号测试仪
-
Application No.: US12354781Application Date: 2009-01-16
-
Publication No.: US07923991B2Publication Date: 2011-04-12
- Inventor: Fa-Sheng Huang
- Applicant: Fa-Sheng Huang
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Zhigang Ma
- Priority: CN200810306573 20081227
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A signal testing apparatus includes a number of first switches, a second switch, and a testing terminal. Each first switch includes a static contact, a first dynamic contact, and a second dynamic contact. The second switch includes a static contact and a number of dynamic contacts. When the static contact and the first dynamic contact of each first switch are connected to each other, a computer interface is connected to a peripheral equipment interface. When the static contact and the second dynamic contact of each first switch are connected to each other, the computer interface is disconnected to the peripheral equipment interface, the static contact of the second switch is capable of selectively connected to one of the dynamic contacts of the second switch, to selectively test a signal output from a corresponding pin of the computer interface.
Public/Granted literature
- US20100164522A1 SIGNAL TESTING APPARATUS Public/Granted day:2010-07-01
Information query