Invention Grant
- Patent Title: Inspection apparatus comprising means for removing flux
- Patent Title (中): 检查装置包括用于去除焊剂的装置
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Application No.: US12330092Application Date: 2008-12-08
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Publication No.: US07924037B2Publication Date: 2011-04-12
- Inventor: Katsuhiro Tanabe
- Applicant: Katsuhiro Tanabe
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Cooper & Dunham LLP
- Priority: JP2007-316967 20071207; JP2008-186863 20080718
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
An inspection apparatus includes an electrical connection member which is configured to remove flux attached to a part to be inspected of an object to be inspected, a base member which is provided with the electrical connection member, a driving member which is configured to move the base member relative to the object to be inspected, a control member which is configured to control an operation of the driving member, and an inspection start-up member which is configured to send an operation start signal to the control member, when the operation start signal is sent from the inspection start-up member to the control member, the base member is moved by the driving member, and the electrical connection member is brought into contact with the part to be inspected of the object to be inspected a predetermined number of times, by a control of the control member.
Public/Granted literature
- US20090146674A1 INSPECTION APPARATUS Public/Granted day:2009-06-11
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