Invention Grant
- Patent Title: Electromagnetic wave measuring method and electromagnetic wave measuring apparatus
- Patent Title (中): 电磁波测量方法和电磁波测量仪器
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Application No.: US12141510Application Date: 2008-06-18
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Publication No.: US07924232B2Publication Date: 2011-04-12
- Inventor: Shoichi Kajiwara , Hiroyuki Tani
- Applicant: Shoichi Kajiwara , Hiroyuki Tani
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2007-163777 20070621
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
An electromagnetic wave measuring method is provided that is capable of performing high-precision measurement in a shorter time and in a greater variety of frequency bands than heretofore with a comparatively simple configuration. A plate-like antenna (13) of which the outline shape of an opposed surface opposite a measured object (5) is similar to the outline shape of an opposed surface of the measured object (5) is brought close to the measured object (5), and an electromagnetic wave from the measured object (5) is measured based on the frequency spectrum of a received signal received by the plate-like antenna (13).
Public/Granted literature
- US20080316123A1 ELECTROMAGNETIC WAVE MEASURING METHOD AND ELECTROMAGNETIC WAVE MEASURING APPARATUS Public/Granted day:2008-12-25
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