Invention Grant
- Patent Title: Resistive memory and data write-in method
- Patent Title (中): 电阻记忆和数据写入方式
-
Application No.: US12561797Application Date: 2009-09-17
-
Publication No.: US07924601B2Publication Date: 2011-04-12
- Inventor: Masaki Aoki
- Applicant: Masaki Aoki
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
An ReRAM of the present invention includes a high speed write-in region and a main memory region, only memory cells designated to have the storage state out of the memory cells corresponded to data are set to the storage state in the high speed write-in region. The data written in the memory cell array are transferred to the main memory region, the memory cells of the memory cell array corresponded to the data transferred from the high speed write-in region are reset to the no-storage state in the main memory region, only the memory cells designated to have the storage state out of the memory cells are set, and all memory cells are reset to the no-storage state, or the initial state, in the high speed write-in region.
Public/Granted literature
- US20100157655A1 RESISTIVE MEMORY AND DATA WRITE-IN METHOD Public/Granted day:2010-06-24
Information query