Invention Grant
- Patent Title: Segmented bitscan for verification of programming
- Patent Title (中): 分段位扫描用于验证编程
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Application No.: US12755610Application Date: 2010-04-07
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Publication No.: US07924625B2Publication Date: 2011-04-12
- Inventor: Yan Li , Teruhiko Kamei , Jeffrey W. Lutze
- Applicant: Yan Li , Teruhiko Kamei , Jeffrey W. Lutze
- Applicant Address: US CA Milpitas
- Assignee: SanDisk Corporation
- Current Assignee: SanDisk Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Vierra Magen Marcus & DeNiro LLP
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.
Public/Granted literature
- US20100195405A1 SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING Public/Granted day:2010-08-05
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