Invention Grant
- Patent Title: Feature point detecting device, feature point detecting method, and feature point detecting program
- Patent Title (中): 特征点检测装置，特征点检测方法和特征点检测程序
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Application No.: US11717139Application Date: 2007-03-13
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Publication No.: US07925048B2Publication Date: 2011-04-12
- Inventor: Koichi Kinoshita
- Applicant: Koichi Kinoshita
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Dickstein Shapiro LLP
- Priority: JP2006-068047 20060313
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
A device and method for detecting feature points of an object from an image. A three-dimensional model is created in which a plurality of nodes corresponding to feature points in a learning image are defined. The model is projected onto an input image and a feature value is derived from a plurality of sampling points around a projection point of each node. An error estimated amount is computed based on the displacement of a feature point between a correct model and an error model. The three dimensional position of each feature point in the input image is estimated based on the error estimated amount and a three dimensional model.
Public/Granted literature
- US20070217683A1 Feature point detecting device, feature point detecting method, and feature point detecting program Public/Granted day:2007-09-20
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