Invention Grant
- Patent Title: Quality control system, analyzer, and quality control method
- Patent Title (中): 质量控制体系,分析仪和质量控制方法
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Application No.: US11903364Application Date: 2007-09-21
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Publication No.: US07925461B2Publication Date: 2011-04-12
- Inventor: Tadayuki Yamaguchi , Atsushi Shirakami , Etsuro Shinkai , Yasuhiro Ochi
- Applicant: Tadayuki Yamaguchi , Atsushi Shirakami , Etsuro Shinkai , Yasuhiro Ochi
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.
Public/Granted literature
- US20080114559A1 Quality control system, analyzer, and quality control method Public/Granted day:2008-05-15
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