Invention Grant
- Patent Title: Graphical analysis to detect process object anomalies
- Patent Title (中): 用于检测过程对象异常的图形分析
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Application No.: US11613413Application Date: 2006-12-20
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Publication No.: US07926026B2Publication Date: 2011-04-12
- Inventor: Udo Klein , Thomas Wieczorek , Daniel Zimmermann , Oliver Sievi , Guenter Pecht-Seibert
- Applicant: Udo Klein , Thomas Wieczorek , Daniel Zimmermann , Oliver Sievi , Guenter Pecht-Seibert
- Applicant Address: DE Walldorf
- Assignee: SAP AG
- Current Assignee: SAP AG
- Current Assignee Address: DE Walldorf
- Agency: Kenyon & Kenyon LLP
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A method and system for graphical analysis to detect anomalies in process objects. The method generates a graph to represent a set of process objects, applies a clustering algorithm to cluster like nodes of the graph, compares the clusters to the process objects, and, if the objects match the clusters, accepts the objects for further review or for use in applications. If one or more of the objects do not match the clusters, such suggests that there are anomalies in the process objects requiring correction. An example implementation may be to detect anomalies in the design of the process objects.
Public/Granted literature
- US20080155335A1 GRAPHICAL ANALYSIS TO DETECT PROCESS OBJECT ANOMALIES Public/Granted day:2008-06-26
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