Invention Grant
- Patent Title: Forming complimentary metal features using conformal insulator layer
- Patent Title (中): 使用保形绝缘层形成互补的金属特征
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Application No.: US11771137Application Date: 2007-06-29
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Publication No.: US07927990B2Publication Date: 2011-04-19
- Inventor: Kang-Jay Hsia , Calvin K Li , Christopher J Petti
- Applicant: Kang-Jay Hsia , Calvin K Li , Christopher J Petti
- Applicant Address: US CA Milpitas
- Assignee: SanDisk Corporation
- Current Assignee: SanDisk Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Vierra Magen Marcus & DeNiro LLP
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method is provided to form densely spaced metal lines. A first set of metal lines is formed by etching a first metal layer. A thin dielectric layer is conformally deposited on the first metal lines. A second metal is deposited on the thin dielectric layer, filling gaps between the first metal lines. The second metal layer is planarized to form second metal lines interposed between the first metal lines, coexposing the thin dielectric layer and the second metal layer at a substantially planar surface. In some embodiments, planarization continues to remove the thin dielectric covering tops of the first metal lines, coexposing the first metal lines and the second metal lines, separated by the thin dielectric layer, at a substantially planar surface.
Public/Granted literature
- US20090004844A1 Forming Complimentary Metal Features Using Conformal Insulator Layer Public/Granted day:2009-01-01
Information query
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