Invention Grant
- Patent Title: Endurance testing system and method
- Patent Title (中): 耐久性测试系统和方法
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Application No.: US12331445Application Date: 2008-12-10
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Publication No.: US07928745B2Publication Date: 2011-04-19
- Inventor: Qiang Qin , Tian-You Liu , Lian-Zhong Gong
- Applicant: Qiang Qin , Tian-You Liu , Lian-Zhong Gong
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agent Zhigang Ma
- Priority: CN200810305506 20081112
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to the first and second detecting apparatuses, and the movement module, for controlling the movement module and counting a first number of times the first detecting apparatus detects the first inductive object, and a second number of times the second detecting apparatus detects the second inductive object. The storage module is connected to the processor, for storing the first and second numbers of times from the processor. The first detecting apparatus fails the testing upon the condition that the first number of times is not equal to the second number of times.
Public/Granted literature
- US20100117639A1 ENDURANCE TESTING SYSTEM AND METHOD Public/Granted day:2010-05-13
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