In one embodiment, apparatus for testing at least one device under test (DUT) includes a tester input/output (I/O) node, a DUT I/O node, a remote pin electronics block, a bypass circuit, and a control system. The remote pin electronics block provides a test function and is coupled between the tester I/O node and the DUT I/O node. The bypass circuit is coupled between the tester I/O node and the DUT I/O node and provides a signal bypass path between the tester I/O node and the DUT I/O node. The signal bypass path bypasses the test function provided by the remote pin electronics block. The control system is configured to enable and disable the bypass circuit. Methods for using this and other related apparatus to test one or more DUTs are also disclosed.