Invention Grant
- Patent Title: Magnetic head inspection system, magnetic head inspection method and magnetic disk drive manufacturing method
- Patent Title (中): 磁头检测系统,磁头检测方法和磁盘驱动器制造方法
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Application No.: US12072751Application Date: 2008-02-27
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Publication No.: US07929255B2Publication Date: 2011-04-19
- Inventor: Hiroshi Umezaki , Shinichi Iwasa
- Applicant: Hiroshi Umezaki , Shinichi Iwasa
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agency: Mahamedi Paradice Kreisman LLP
- Agent Christopher J. Brokaw
- Priority: JP2007-046733 20070227
- Main IPC: G11B21/10
- IPC: G11B21/10

Abstract:
Embodiments of the present invention provide a magnetic head inspection system having a simple configuration capable of inspecting magnetic heads. According to one embodiment, the magnetic head inspection system comprises an inspection module which is provided with a magnetic disk where servo data including track identifier information are recorded, a spindle motor, a carriage having a mount structure to which a head assembly containing a magnetic head is secured, a voice coil motor and a main circuit section. An inspection circuit section instructs the main circuit section to execute control so as to move the magnetic head to a specific track and perform a certain read write operation by the magnetic head in order to inspect the magnetic head.
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Information query
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