Invention Grant
US07930604B1 Apparatus and method for testing and debugging an integrated circuit 有权
用于集成电路测试和调试的装置和方法

Apparatus and method for testing and debugging an integrated circuit
Abstract:
A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.
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