Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US11803778Application Date: 2007-05-16
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Publication No.: US07931861B2Publication Date: 2011-04-26
- Inventor: Nobuhiro Kitagawa
- Applicant: Nobuhiro Kitagawa
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-139319 20060518
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N31/00 ; G01N33/00 ; B65G47/12 ; B65G43/00

Abstract:
The present invention is to present a sample analyzer which can conduct a stable feeding of container used for preparing a measuring sample. The sample analyzer comprises: a first storage section for storing a plurality of containers, the container used for preparing a measurement sample; a first transport section for transporting the containers stored in the first storage section; a second storage section for storing the containers transported by the first transport section; a second transport section for transporting one by one the containers stored in the second storage section; a detector for detecting a state of transporting containers by the second transport section; a controller for controlling an operation of the first transport section based on a detection result of the detector; a sample preparing section for preparing a measurement sample in the container transported by the second transport section; and an analyzing section for analyzing the measurement sample prepared by the sample preparing section.
Public/Granted literature
- US20070269342A1 Sample analyzer Public/Granted day:2007-11-22
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