Invention Grant
- Patent Title: Semiconductor contact device
- Patent Title (中): 半导体接触器件
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Application No.: US11424394Application Date: 2006-06-15
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Publication No.: US07932557B2Publication Date: 2011-04-26
- Inventor: Paul J. Rudeck
- Applicant: Paul J. Rudeck
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: H01L29/66
- IPC: H01L29/66

Abstract:
The invention provides an advanced metallization technique for fabricating a memory cell array on a substrate. The array is fabricated by forming discrete and self-aligned vias in a first layer disposed over the array to form contacts to each of the source and drain junction in the array. Further, self-aligned local area slotted vias are formed in a second layer that is disposed over the first layer to form local area interconnects that electrically shunt all of the source contacts/junctions. Further, discrete self-aligned drain extensions are formed over each of the formed drain contacts to electrically connect the junctions, and source contacts to the extensions. The formed vias, extensions, and slotted local area vias are simultaneously plugged and filled with a conductive material to form the memory cell array.
Public/Granted literature
- US20060237800A1 SEMICONDUCTOR CONTACT DEVICE Public/Granted day:2006-10-26
Information query
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