Invention Grant
US07932560B2 Method of fabricating a semiconductor on insulator device having a frontside substrate contact
有权
制造具有前面衬底接触的绝缘体上半导体器件的方法
- Patent Title: Method of fabricating a semiconductor on insulator device having a frontside substrate contact
- Patent Title (中): 制造具有前面衬底接触的绝缘体上半导体器件的方法
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Application No.: US12160782Application Date: 2007-01-10
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Publication No.: US07932560B2Publication Date: 2011-04-26
- Inventor: Piebe A. Zijlstra
- Applicant: Piebe A. Zijlstra
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP06100281 20060112
- International Application: PCT/IB2007/050077 WO 20070110
- International Announcement: WO2007/080545 WO 20070719
- Main IPC: H01L27/12
- IPC: H01L27/12

Abstract:
A method of forming a substrate contact in a semiconductor device, comprising the steps of providing a semiconductor base substrate (2) having a buried oxide (BOX) layer (4) and a thin active semiconductor layer (103) on the BOX layer (4), forming a trench (104) in the active semiconductor layer (103) and the Box layer (4) to the semiconductor base substrate (2) below, and then depositing another active semiconductor (epitoxial) layer (6) over the remaining active semiconductor layer (103) and in the trench (104) to create the substrate contact. The trench (104) is etched at a location on the wafer corresponding to a scribe lane (106).
Public/Granted literature
- US20100163993A1 METHOD OF FABRICATING A SEMICONDUCTOR ON INSULATOR DEVICE HAVING A FRONTSIDE SUBSTRATE CONTACT Public/Granted day:2010-07-01
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