Invention Grant
US07932738B1 Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit
有权
用于读取高压集成电路中的可编程反熔丝元件的方法和装置
- Patent Title: Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit
- Patent Title (中): 用于读取高压集成电路中的可编程反熔丝元件的方法和装置
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Application No.: US12800054Application Date: 2010-05-07
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Publication No.: US07932738B1Publication Date: 2011-04-26
- Inventor: Sujit Banerjee , Giao Minh Pham
- Applicant: Sujit Banerjee , Giao Minh Pham
- Applicant Address: US CA San Jose
- Assignee: Power Integrations, Inc.
- Current Assignee: Power Integrations, Inc.
- Current Assignee Address: US CA San Jose
- Agency: The Law Office of Bradley J. Bereznak
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
In a method for reading a programmable anti-fuse block of a high-voltage integrated circuit a first voltage is applied to a first pin of the HVIC, the first voltage being lowered to a second voltage at a first node. Current is shunted from the first node, thereby lowering the second voltage to a third voltage. An isolation circuit block is then activated to couple the third voltage to a common node of the programmable anti-fuse block, the common node being coupled to a plurality of anti-fuses, each anti-fuse having a programmed state. A read signal is generated that causes a voltage potential representative of the programmed state of each anti-fuse to be latched into a corresponding latch element.
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