Invention Grant
US07932762B2 Latch and DFF design with improved soft error rate and a method of operating a DFF
有权
Latch和DFF设计具有改进的软错误率和操作DFF的方法
- Patent Title: Latch and DFF design with improved soft error rate and a method of operating a DFF
- Patent Title (中): Latch和DFF设计具有改进的软错误率和操作DFF的方法
-
Application No.: US12337628Application Date: 2008-12-18
-
Publication No.: US07932762B2Publication Date: 2011-04-26
- Inventor: Mark F. Turner , Jeff S. Brown
- Applicant: Mark F. Turner , Jeff S. Brown
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Main IPC: H03K3/037
- IPC: H03K3/037 ; H03K3/3562

Abstract:
A single-path latch, a dual-path latch, a method of operating a DFF and a library of cells. In one embodiment, the single-path latch includes: (1) a passgate coupled to the data input, (2) a feedback path coupled to the passgate, the data output coupled thereto and (3) tristate circuitry coupled to the passgate and having a single transistor pair of opposite conductivity coupled to Boolean logic gates, the Boolean logic gates configured to control operation of the single transistor pair based on the data input and a pulse clock signal to drive the feedbacks path.
Public/Granted literature
- US20100156494A1 LATCH AND DFF DESIGN WITH IMPROVED SOFT ERROR RATE AND A METHOD OF OPERATING A DFF Public/Granted day:2010-06-24
Information query
IPC分类: