Invention Grant
- Patent Title: Distance measuring device and distance measuring method
- Patent Title (中): 距离测量装置和距离测量方法
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Application No.: US11991384Application Date: 2006-08-25
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Publication No.: US07932855B2Publication Date: 2011-04-26
- Inventor: Tetsuji Uebo
- Applicant: Tetsuji Uebo
- Applicant Address: JP Wakayama-Shi
- Assignee: Saika Technological Institute Foundation
- Current Assignee: Saika Technological Institute Foundation
- Current Assignee Address: JP Wakayama-Shi
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2005-255595 20050902; JP2006-054485 20060301
- International Application: PCT/JP2006/316683 WO 20060825
- International Announcement: WO2007/029519 WO 20070315
- Main IPC: G01S13/00
- IPC: G01S13/00 ; G01S13/08

Abstract:
There are provided a distance measuring device and a distance measuring method characterized by “simple configuration”, “capability of measuring a near distance”, and “a small measurement error” like a distance measuring device using a standing wave. The distance measuring device includes a signal source (1) for outputting a signal having a plurality of different frequency components within a particular bandwidth, a transmission unit (2) for transmitting a signal as an undulation, s mixed wave detection unit (3) for detecting a mixed wave VC obtained by mixing a progressive wave VT transmitted and a reflected wave VRk of the progressive wave VT reflected by a measurement object (6), a frequency component analysis unit (4) for analyzing the frequency component of the mixed wave VC detected, and a distance calculation unit (5) for obtaining a distance spectrum by subjecting the analyzed data further to spectrum analysis, thereby calculating the distance to the measurement object (6).
Public/Granted literature
- US20090251360A1 Distance measuring device and distance measuring method Public/Granted day:2009-10-08
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