Invention Grant
US07932938B2 Method, apparatus and system providing adjustment of pixel defect map
有权
提供像素缺陷图的调整的方法，装置和系统
- Patent Title: Method, apparatus and system providing adjustment of pixel defect map
- Patent Title (中): 提供像素缺陷图的调整的方法，装置和系统
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Application No.: US11509712Application Date: 2006-08-25
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Publication No.: US07932938B2Publication Date: 2011-04-26
- Inventor: Igor Subbotin
- Applicant: Igor Subbotin
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: H04N5/217
- IPC: H04N5/217 ; H04N9/64
Abstract:
A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
Public/Granted literature
- US20080049125A1 Method, apparatus and system providing adjustment of pixel defect map Public/Granted day:2008-02-28
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