Invention Grant
- Patent Title: Overcurrent detection device
- Patent Title (中): 过电流检测装置
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Application No.: US11524296Application Date: 2006-09-21
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Publication No.: US07933103B2Publication Date: 2011-04-26
- Inventor: Shunzou Ohshima
- Applicant: Shunzou Ohshima
- Applicant Address: JP Toko
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Toko
- Agency: Sughrue Mion, PLLC
- Priority: JPP2005-274369 20050921
- Main IPC: H02H3/08
- IPC: H02H3/08

Abstract:
Disclosed is an overcurrent detection device for detecting an overcurrent in a load circuit which is arranged to control the driving and the stopping of a load 1 by a semiconductor switch (FET1) provided between a battery VB and the load 1. An added voltage (V1−V3) is generated which is obtained by adding a voltage (V1−V2) generated across the both ends of the semiconductor switch (FET1) to a voltage (V3−V2) which is generated at the time of current change due to the inductance Lp of a copper foil wiring pattern 3 for coupling the semiconductor switch (FET1) and the load 1. A comparator CMP1 for comparing the added voltage with an overcurrent determination voltage (V1−V4) set in advance is provided. When the comparator CMP1 detects that the added voltage exceeds the overcurrent determination voltage, it is determined that an overcurrent is generated.
Public/Granted literature
- US20070064368A1 Overcurrent detection device Public/Granted day:2007-03-22
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