Invention Grant
US07933147B2 Sensing circuit of a phase change memory and sensing method thereof
有权
相变存储器的感测电路及其感测方法
- Patent Title: Sensing circuit of a phase change memory and sensing method thereof
- Patent Title (中): 相变存储器的感测电路及其感测方法
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Application No.: US11968041Application Date: 2007-12-31
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Publication No.: US07933147B2Publication Date: 2011-04-26
- Inventor: Lieh-Chiu Lin , Shyh-Shyuan Sheu , Pei-Chia Chiang
- Applicant: Lieh-Chiu Lin , Shyh-Shyuan Sheu , Pei-Chia Chiang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Priority: TW96122876A 20070625
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A sensing circuit of a phase change memory. The sensing circuit comprises a data current source and a reference current source, a storage memory device and a reference memory device, a storage switch and a reference switch, an auxiliary current source and a comparator. First terminals of the storage memory device and the reference memory device are respectively coupled to the data current source and the reference current source. The storage switch and the reference switch are respectively coupled to second terminals of the storage memory device and the reference memory device. The auxiliary current source is dynamically coupled to the first terminals of the storage memory device and the reference memory device. The comparator is coupled to the first terminals of the storage memory device and the reference memory device.
Public/Granted literature
- US20080316803A1 SENSING CIRCUIT OF A PHASE CHANGE MEMORY AND SENSING METHOD THEREOF Public/Granted day:2008-12-25
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