Invention Grant
US07934417B2 Scanning probe microscope 有权
扫描探针显微镜

  • Patent Title: Scanning probe microscope
  • Patent Title (中): 扫描探针显微镜
  • Application No.: US10598045
    Application Date: 2005-02-14
  • Publication No.: US07934417B2
    Publication Date: 2011-05-03
  • Inventor: Markus HundHans Herold
  • Applicant: Markus HundHans Herold
  • Applicant Address: DE Bayreuth
  • Assignee: Markus Hund
  • Current Assignee: Markus Hund
  • Current Assignee Address: DE Bayreuth
  • Agency: Workman Nydegger
  • Priority: DE102004008852 20040220; DE102004040188 20040819; DE102004043191 20040903
  • International Application: PCT/EP2005/001456 WO 20050214
  • International Announcement: WO2005/083717 WO 20050909
  • Main IPC: G01B5/28
  • IPC: G01B5/28
Scanning probe microscope
Abstract:
Implementations of the present invention relate to a scanning probe microscope, which includes a base frame to which a probe holder with a probe as well as a probe support are, or can be fixed. The probe and the sample mount can be moved relative to one another in order to obtain information about the surface of the sample by scanning a sample which is arranged on the sample mount. Furthermore, a reaction chamber can be attached to the base frame of the scanning probe microscope, with the sample mount arranged therein. The reaction chamber has an opening on its side facing the probe, through which the probe can enter the reaction chamber. The reaction chamber can enable treatment of the sample's surface by the specific influence of fluids within the reaction chamber when the reaction chamber is closed.
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