Invention Grant
- Patent Title: Wire bonding method
- Patent Title (中): 接线方式
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Application No.: US12384643Application Date: 2009-04-07
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Publication No.: US07934634B2Publication Date: 2011-05-03
- Inventor: Tatsunari Mii , Tishihiko Toyama , Shinsuke Tei
- Applicant: Tatsunari Mii , Tishihiko Toyama , Shinsuke Tei
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Shinkawa
- Current Assignee: Kabushiki Kaisha Shinkawa
- Current Assignee Address: JP Tokyo
- Agency: DLA Piper LLP (US)
- Priority: JP2005-31701 20050208
- Main IPC: B23K31/02
- IPC: B23K31/02

Abstract:
A wire bonding method with the process of performing a first bonding to a pad of a die that is a first bond point, and the process of performing a second bonding to an interconnect wiring (or a lead) that is a second bond point, thus connecting the pad and the interconnect wiring with a wire. A bump is first formed on a pad, and, in a wire cutting step performed during the step of forming the bump, the wire protruding from the tip end of a capillary is bent in the lateral direction to form a bent part, and then the bent part is bonded to the bump, thus completing the first bonding process; after which the wire is bonded to the interconnect wiring, thus completing the second bonding process.
Public/Granted literature
- US20090194577A1 Wire bonding method Public/Granted day:2009-08-06
Information query
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