Invention Grant
- Patent Title: Film forming method
- Patent Title (中): 成膜方法
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Application No.: US10488405Application Date: 2002-09-02
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Publication No.: US07935384B2Publication Date: 2011-05-03
- Inventor: Toshio Hasegawa
- Applicant: Toshio Hasegawa
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2001-265243 20010903
- International Application: PCT/JP02/08878 WO 20020902
- International Announcement: WO03/021650 WO 20030313
- Main IPC: C23C16/34
- IPC: C23C16/34

Abstract:
The present invention relates to a method of forming a metal-nitride film onto a surface of an object to be processed in a processing container in which a vacuum can be created. The method of the invention includes: a step of continuously supplying an inert gas into a processing container set at a low film-forming temperature; and a step of intermittently supplying a metal-source gas into the processing container, during the step of continuously supplying the inert gas. During the step of intermittently supplying the metal-source gas, a nitrogen-including reduction gas is supplied into the processing container at the same time that the metal-source gas is supplied, during a supply term of the metal-source gas. The nitrogen-including reduction gas is also supplied into the processing container for a term shorter than a non-supply term of the metal-source gas, during the non-supply term of the metal-source gas. According to the invention, a metal-nitride film can be deposited whose chlorine density is low, whose resistivity is low, in which less cracks may be generated, and whose abnormal growth may not be generated.
Public/Granted literature
- US20040235191A1 Film forming method Public/Granted day:2004-11-25
Information query
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