Invention Grant
US07935585B2 Method of fabricating semiconductor device and method for fabricating electronic device
失效
制造半导体器件的方法和用于制造电子器件的方法
- Patent Title: Method of fabricating semiconductor device and method for fabricating electronic device
- Patent Title (中): 制造半导体器件的方法和用于制造电子器件的方法
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Application No.: US11905961Application Date: 2007-10-05
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Publication No.: US07935585B2Publication Date: 2011-05-03
- Inventor: Mitsuru Sato , Sumio Utsunomiya
- Applicant: Mitsuru Sato , Sumio Utsunomiya
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-277932 20061011
- Main IPC: H01L21/84
- IPC: H01L21/84

Abstract:
A method for fabricating a semiconductor device, comprising: forming a semiconductor film on a substrate; and recrystallizing the semiconductor film using as a heat source flame of a gas burner that uses hydrogen and oxygen gas mixture as a fuel.
Public/Granted literature
- US20080090388A1 Method of fabricating semiconductor device and method for fabricating electronic device Public/Granted day:2008-04-17
Information query
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