Invention Grant
US07935925B2 Charged particle beam scanning method and charged particle beam apparatus 有权
带电粒子束扫描法和带电粒子束装置

Charged particle beam scanning method and charged particle beam apparatus
Abstract:
In a method of scanning a charged particle beam which can position the scan position to a proper location inside a deflectable range of the scan position of charged particle beam, the scan position of charged particle beam is deflected to a plurality of target objects inside a scan position deflectable region and on the basis of a shift of a target object at a scan location after deflection, the deflection amount at the scan location is corrected.
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