Invention Grant
- Patent Title: Charged particle beam scanning method and charged particle beam apparatus
- Patent Title (中): 带电粒子束扫描法和带电粒子束装置
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Application No.: US11889057Application Date: 2007-08-08
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Publication No.: US07935925B2Publication Date: 2011-05-03
- Inventor: Yuko Sasaki , Makoto Ezumi , Makoto Nishihara , Tsutomu Kawai , Toshiaki Yanokura
- Applicant: Yuko Sasaki , Makoto Ezumi , Makoto Nishihara , Tsutomu Kawai , Toshiaki Yanokura
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-261651 20060927
- Main IPC: H01J37/304
- IPC: H01J37/304

Abstract:
In a method of scanning a charged particle beam which can position the scan position to a proper location inside a deflectable range of the scan position of charged particle beam, the scan position of charged particle beam is deflected to a plurality of target objects inside a scan position deflectable region and on the basis of a shift of a target object at a scan location after deflection, the deflection amount at the scan location is corrected.
Public/Granted literature
- US20080073528A1 Charged particle beam scanning method and charged particle beam apparatus Public/Granted day:2008-03-27
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