This document discusses, among other things, an implantable apparatus comprising a plurality of solid state electronic circuits disposed at a plurality of different locations in the apparatus, a plurality of ionizing radiation exposure sensors disposed at the different locations and configured to generate an indication of a non-single-event-upset (non-SEU) effect to the solid state electronic circuit from an exposure to ionizing radiation, wherein the ionizing radiation exposure sensors respectively monitor at least two different types of operating parameters of respectively correspondingly located solid state circuits, and a controller circuit communicatively coupled to the ionizing radiation exposure sensors, wherein the controller circuit is configured to quantify the effect to the solid state electronic circuits using the different monitored operating parameters.