Invention Grant
- Patent Title: Memory device and a semiconductor device
- Patent Title (中): 存储器件和半导体器件
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Application No.: US11496461Application Date: 2006-08-01
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Publication No.: US07935957B2Publication Date: 2011-05-03
- Inventor: Mikio Yukawa
- Applicant: Mikio Yukawa
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2005-234387 20050812
- Main IPC: H01L51/46
- IPC: H01L51/46 ; H01L51/54

Abstract:
The present invention provides a memory device and a semiconductor device which have high reliability for writing at low cost. Furthermore, the present invention provides a memory device and a semiconductor device having a non-volatile memory element in which data can be additionally written and which can prevent forgery due to rewriting and the like. The memory element includes a first conductive layer, a second conductive layer, and an organic compound layer, which is formed between the first conductive layer and the second conductive layer, and which has a photosensitized oxidation reduction agent which can be an excited state by recombination energy of electrons and holes and a substance which can react with the photosensitized oxidation reduction agent.
Public/Granted literature
- US20070034865A1 Memory device and a semiconductor device Public/Granted day:2007-02-15
Information query
IPC分类: